Test equipment for every occasion
05 October 2010
A portfolio of Tektronix’s test products will be on show at electronica 2010.
The Tektronix products on display will address a range of applications, from high-speed serial data and embedded systems to signal integrity and RF test. Visitors to the stand will be able to get hands-on demonstrations and technical advice to help them solve their test and measurement challenges.
Highlights will include the new TLA6200 Series of Logic Analysers, which can debug, validate, and optimise the functionality of modern digital systems. The TLA6200 Series also provides a comprehensive set of signal integrity debug tools that allow users to isolate, identify, and characterise elusive and hard-to-find problems.
In addition, the new FCA3000 and FCA3100 Timer/Counter/Analyser Series incorporates different functions into one instrument. The FCA Series comes with deep internal memory and a fast data transfer rate of 250k samples/s to internal memory. The multi-parameter display shows auxiliary measurements alongside the main measurements, providing at-a-glance insight into results.
Also on display will be the new MCA3000 Series of microwave counter/analysers, which come with two 300 MHz input channels, and the choice of a 27 GHz or 40 GHz high frequency input channel; two instruments in one with all the same functionality as the FCA3000 Series.
The new PWS4000 Programmable Power Supply Series that offers wide voltage and current ranges will be demonstrated, too. A basic voltage accuracy of 0.03% and less than 5 mVp-p noise means that engineers can be confident in the power supply’s output value. Tektronix has also introduced the new PWS2000 Series Power Supply Series, which is designed with performance and intuitive operation in mind. Wide current and voltage ranges (+ 10 mV and 10 mA resolution) satisfy a variety of applications, offering the power generation performance engineers need.
The AWG7000C and AWG5000C Series are new Arbitrary Waveform Generators (AWGs). This ‘C’ series of AWG instruments provide a 45% reduction in waveform creation times compared to previous AWG instruments, essential for performance-intensive applications where large number of waveforms are required to effectively characterise high-speed serial and wideband RF/Microwave designs. Also on show will be the bench-top AFG3000 Series Arbitrary / Function Generator, which supports a wide range of application needs with one instrument (with 12 standard waveforms, arbitrary waveform capability, and signal impairment options).
The recently introduced BERTScope range of Bit Error Rate Testers will be at electronica, too. The BERTScope range includes the BSA Series, which is ideal for signal integrity measurements, the CR (Clock Recovery) Series which delivers the flexibility and accuracy needed for compliance testing, and the DPP (Digital Pre-Emphasis) Series processor which acquires single-ended inputs of data and clock, and conditions the signal by adding controllable amounts of pre-emphasis. Also available is the BitAlyzer BA series for addressing signal integrity and BER issues faced by designers of sophisticated electronic and satellite communication systems.
The RSA6000 Series features industry-leading dynamic range and bandwidth combination, coupled with the DPX Live RF spectrum display, offering engineers immediate confidence in the stability of their design, and instant display of faults when they occur. The high-performance RSA6120A spectrum analyser will also be on show, which extends all of the capabilities of the RSA6000 Series out to 20 GHz, allowing designers to apply the spectrum analyser’s capabilities throughout the entire Ku band.
A wide selection of Tektronix oscilloscopes will also be on show, including mixed-signal solutions for every application. These range from the MSO2000 and MSO3000 Series to the high performance MSO70000 Series, which combines bandwidth of 20 GHz with the industry's highest waveform capture rate, best signal fidelity, lowest noise floor and the only available hardware-based serial pattern trigger for data rates up to 5 Gb/s.
Also, the recently introduced DMM4000 Series of 5.5 digit and 6.5 digit resolution digital multimeters (DMM) which are designed to help engineers debug complex electronics systems and validate circuit design through precision measurements and in-depth analysis capabilities can be seen at the show. The DMM4000 Series also integrates with National Instruments’ LabVIEW SignalExpress interactive instrument software, allowing fast acquisition, analysis and presentation of data from numerous instruments.
At electronica 2010, Tektronix will be demonstrating its range of probing solutions, including the P7500 TriMode probing system with bandwidths that are perfectly matched to the DPO/DSA70000B and MSO70000 Series.
The P7500 TriMode probes allow engineers to switch among differential, single ended, and common-mode measurements without moving the probe from its connection points. The P7500 Series offers probes with performance from 4 GHz to 20 GHz and offers several low-cost solder tips with quick connection features that allow users to quickly and easily move the probe to various solder points on a circuit. Also on show will be the P6780 and P6717 logic probes, which (when used with the MSO70000) offer the low loading and small size required to test high performance digital designs.
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