Editorial archive;
Test&Measurement instrumentation now at 20% off list! (22 May 2012)
Five-in-one Sourcing & Measurement SourceMeter instruments (SMU), integrated switch/ multimeter instruments, and a series of power supplies now available with a 20% discount! Limited time offer only!
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Outstanding Price Offer for Test and Measurement Equipment from Keithley Instruments (19 April 2012)
20% discount on selected general purpose instruments until 30 June.
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Keithley Publishes 2012 Test & Measurement (23 February 2012)
Keithley Instruments, Inc., world leader in advanced electrical test instruments and systems, has published its 2012 Test & Measurement Product Catalog.
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Keithley Publishes CD on High Performance Source Measurement Solutions (21 November 2011)
Keithley Instruments, Inc., Inc., a world leader in advanced electrical test instruments and systems, has published an informative CD entitled, “Configuring Cost-Effective, High Performance Sourcing and Measurement Solutions.”
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20% discount on new Source and Measure Instrument! (15 November 2011)
Keithley offers it´s new Model 2401 at an introductory price of only £ 2016. List prices of other SourceMeters have been reduced by up to 17%!
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High power and high voltage (04 April 2011)
Keithley‘s System SourceMeter instrument is optimised for high power semiconductor test.
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Test&Measurement instrumentation now at 20% off list! (08 February 2011)
An LXI Arbitrary Waveform/Function Generator, Five-in-One Sourcing & Measurement instruments, USB/IEEE-488/Ethernet DMMs, and more now available with a 20% discount! Limited time offer only!
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Free White Paper: the Basics of Electrical Measurements (26 January 2011)
This White Paper describes a four step process that greatly increases the chances of building a test system that meets requirements and eliminates unpleasant and expensive surprises. Download the White Paper now!
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Used Test & Measurement equipment at 30% off list price! (03 November 2010)
Keithley Instruments now offers used T&M instruments at 30% off the list price of a new unit. All instruments are reburbished, fully calibrated, and come with a standard 1-year warranty. Get full programme details
here!
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Used Test & Measurement equipment at 30% off list price! (02 November 2010)
Keithley Instruments now offers used T&M instruments at 30% off the list price of a new unit. All instruments are reburbished, fully calibrated, and come with a standard 1-year warranty.
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Keithley ACS Basic Edition Version 1.2 Provides New Levels of Usability, Convenience, and Productivity for Semiconductor Test Applications (07 October 2010)
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications.
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Keithley Introduces Low-Cost, Full-Featured USB-to-GPIB Interface Adapter (23 June 2010)
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.
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Common challenges in voltage switching (21 April 2010)
Designing an automated test system’s switching demands an understanding of the signals to be switched and the test to be performed, says Dale Cigoy. For example, the most appropriate switch cards and techniques to use in applications that entail switching voltage signals will depend on the magnitude and impedance of the voltages involved
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NEW FREE CD: all about Digital Multimeters (17 March 2010)
Keithley has packed comprehensive technical information about DMMs on a CD and makes it available to interested engineers free of charge. Learn all about DMMs and request your FREE CD today!
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How to make accurate measurements of low electrical signals! (22 February 2010)
Access Keithley´s Microsite including a guide to understanding electrical low level measurements: DC Currents, High Resistances, Low DC Voltages, and Low Resistances. Free access here!
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Learn how to get the most from a Digital Multimeter (27 January 2010)
Access this FREE Microsite from Keithley including comprehensive information about understanding DMM types, applications, and specifications. Click here for free access to the DMM Microsite!
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Free Technical Test&Measurement Live Web Seminar: (30 November 2009)
"Photovoltaic Measurements: Testing the Electrical Properties of Today´s Solar Cells"
45 min presentation/sound including live Questions&Answers. Click here for details and to register!
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Keithley Expands Range of DC Source-Measure Instruments Compatible with ACS Basic Edition Software (23 November 2009)
Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation.
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Keithley White Paper Describes Semiconductor Characterization and Parametric Test Challenges (22 April 2009)
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry.
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Keithley European Seminar Tour to Visit Four UK Locations in May (27 March 2009)
Series of live technical lectures covers test and measurement innovations in wireless/RF, nanotechnology and electronic systems
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Switching characteristics (24 March 2009)
Triaxial cable kits enable fast device characterisation.
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Keithley Releases New 2009 Test And Measurement Product Guide (13 February 2009)
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New Tutorial Poster for WiMAX Measurement from Keithley for Free Download at www.keithley.info/wimaxposter (04 September 2008)
Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published a new poster that illustrates the key measurement tools and software analysis techniques required for measuring complex WiMAX signals.
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Measuring phase locked loops (06 August 2008)
The frequency settling time of a PLL (phase locked loop) is a critical specification for many RF circuits
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WiMAX testing capability added to RF test instruments (20 June 2008)
Signal creation and analysis tools that extend RF test capabilities to include WiMAX signal testing have been launched by Keithley.
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New 2008 Test&Measurement Catalogue from Keithley (04 March 2008)
The catalogue offers details on Keithley's broad array of products for general-purpose and specific applications.
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Extended nanotech current test (01 November 2007)
By extending the current range in its SourceMeter 2600 instruments, Keithley Instrument (www.keithley.com) has introduced two models suitable for photo diode, photo sensors and other optical devices, as well as nanotechnology devices that require, a low current for semiconductor parametric analysis and test. Model 2635 is a single channel meter and 2636 is a dual channel model which lower the current range to 1femtoA (1fA) or (10-(power)15A).
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Methodologies for mobiles (01 October 2006)
Mobile phones are complex enough, and the continual addition of features further challenges test engineers to prevent test time from rising. Due to short product life cycles, phone production lines must be able to manufacture a variety of products with a range of features
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Thrive on variation (01 August 2006)
New avenues for test equipment may create some unusual applications and test the ingenuity of designers, writes TOM BRESLIN
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