Editorial archive;
Optimise your RF Measurements: 7-part Webcast Series (06 February 2012)
The integration of wireless connectivity demands that test engineers understand a breadth of RF & wireless test techniques. NI provides a suite of test equipment and software to increase test reliability and accuracy as well as reduce test times.
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Test Webcast Series: Optimise your Automated Test System (06 February 2012)
This 6-part webcast series, presented by National Instruments, will provide tips and techniques for developing automated test systems, whilst also highlighting the key enabling technologies that make this possible, from modular instrumentation to test executive software.
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NI Technical Symposium 2012 tours UK & Ireland in February (10 January 2012)
National Instruments Technical Symposium is a free one-day technical conference drawn from the most popular sessions at NIDays 2011, and offering technical sessions and hands-on training covering the latest technology innovations for test, control and design.
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NI Introduces New Levels of Productivity with LabVIEW 2011 (14 November 2011)
National Instruments has unveiled NI LabVIEW 2011, the 25th-anniversary version of its award-winning system design software.
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NIDays 2011 - Keynote: Engineering the Olympics - 9th November, London (01 November 2011)
NIDays is the annual professional development conference for engineers, scientists and educators in measurement, automation and embedded design, held this year at The QEII Conference Centre.
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National Instruments Introduces New Levels of Productivity (06 September 2011)
NI has unveiled LabVIEW 2011, the 25th-anniversary version of its award-winning system design software. LabVIEW 2011 can increase efficiency through engineering-specific libraries and its ability to interact with almost any hardware device or deployment target.
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Watching the walk (27 July 2011)
Off-the-shelf software has been used by a team at Oxford Brookes University to develop a user-friendly way for clinicians to select variables to perform gait analysis that is lower-cost and more efficient than current methods, but still provides important clinical measures to assist rehabilitation.
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Summer of LabVIEW 12-part Webcast Series: Register Now! (19 July 2011)
For 25 years, NI LabVIEW graphical programming has revolutionised the development of measurement, automation and embedded applications. Regardless of experience, engineers and scientists can learn how to interface with measurement and control hardware.
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Explore the NI UK Webcast Library, Watch Content On-Demand (14 June 2011)
Experience National Instruments technologies for measurement and control without leaving your desk by viewing the NI UK library of webcasts on-demand. Recent topics delivered by local experts include Test, Prototyping, Robotics, and Green Engineering.
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NI Aerospace & Defence Forum 2011 (24 May 2011)
Learn about the latest developments in automated test, measurement & control technologies and RF & wireless communications specifically for the military & aerospace industries. Hear from NI and industry engineers at this FREE one-day technical conference!
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Search More Than 9,000 Instrument Drivers to Simplify and Automate Instrument Control (19 April 2011)
National Instruments now offers more than 9,000 drivers from more than 350 vendors through the Instrument Driver Network (IDNet) that simplify and automate connection to stand-alone instruments. IDNet, the industry’s largest source of instrument drivers.
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Automated Vector Network Analysis in a small PXI footprint (19 April 2011)
The addition of the NI PXIe-5630 6 GHz VNA to the RF instrument family reflects National Instruments' commitment to deliver high-performance modular instruments at a fraction of the cost of traditional box instruments.
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Test Webcast Series: Learn How to Optimise Your Automated Test System (05 April 2011)
This six-part webcast series, presented by National Instruments, provides tips and techniques for developing automated test systems and highlights the key enabling technologies that make this possible.
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Test Webcast Series: Learn How to Optimise Your Automated Test System (22 February 2011)
This six-part webcast series, presented by National Instruments, provides techniques for developing automated test systems and highlights the technologies that make this possible.
Read more... More..
Call for papers: Share your expertise in our technical case study contest (15 February 2011)
Submit your most innovative solution for measurement and automation to the NIDays Graphical System Design Case Study Contest.
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Industrial touch panel computers (08 February 2011)
Engineers can program HMIs with NI LabVIEW for flexible, simplified application deployment.
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Get Hands-On with Data Acquisition and NI LabVIEW (08 February 2011)
Learn how to build high-performance, PC-based measurement systems in minutes.
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NI Technical Symposium (18 January 2011)
The NI Technical Symposium is a FREE, one-day professional development series for engineers and scientists, with content drawn from the most popular sessions at NIDays 2010.
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NIDays 2010 - See What You Missed (14 December 2010)
More than 500 delegates attended NIDays 2010, experiencing over 50 in-depth technical presentations and hands-on sessions covering the latest NI measurement and automation technologies for test, control and design applications.
View live session recordings, download the presentations and pre-register for 2011.
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Vets turn to LabVIEW (20 October 2010)
Their challenge was to quickly develop and deploy an embedded, multi-modality diagnostic imaging system for small animal veterinary practices.
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NIDays 2010: Brian Cox to give Keynote – Why We Need Explorers (17 September 2010)
NIDays is the annual professional development conference and exhibition for engineers and scientists involved in measurement, automation and embedded design.
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Beyond imagination: The reality of robotics (30 August 2010)
The age of the robot is now with us! Tristan Jones takes a look at the progress being made in this field and the enabling technology behind it..
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Introducing LabVIEW 2010: graphical development for engineers & scientists (24 August 2010)
With simplified hardware configuration, an improved compiler that generates optimised machine code, and features designed by the LabVIEW Community, first-time users and long-time experts will be more productive with LabVIEW 2010. Learn more about the latest version and the top 10 features that will make you more productive at
http://ni.com/labview More..
Improve your proficiency & learn what's new at LabVIEW 2010 Developer Days (10 August 2010)
Whether you're evaluating, getting started with or developing with LabVIEW, NI LabVIEW Developer Days offer introductory and advanced technical sessions designed to improve your product skills, knowledge and productivity using NI LabVIEW.
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Introducing LabVIEW 2010: graphical development for engineers & scientists (03 August 2010)
With simplified hardware configuration, an improved compiler that generates optimised machine code, and features designed by the LabVIEW Community, first-time users and long-time experts will be more productive with LabVIEW 2010.
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NI offers software grants (28 May 2010)
National Instruments has launched its 2010 programme to support embedded developers
in the SME environment.
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Automated Test Summit: Register now for this industry event! (20 April 2010)
Come along to our Automated Test Summit and learn more about top trends influencing the automated test industry. The Keynote address is from Electronic Design columnist and NI VP for Test, Eric Starkloff. Find out more and register online.
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NI LabVIEW graphical software and RIO hardware for robotics (13 April 2010)
Robots mean many things to many people, and NI offers intuitive and productive tools for everything from designing autonomous vehicles and integrating measurements and vision with fixed-base industrial robots to teaching robotics design principals. Explore the NI robotics platform and application areas.
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Stroke of genius as patients recover with robots (29 March 2010)
With stroke responsible for most adult disabilities in the UK, a quarter of which still exist five years later, the University of Leeds embarked on a project to find a way of reducing the recovery time by the use of therapeutic robots.
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Advanced Technologies & Applications in Military & Aerospace (24 March 2010)
Come along and custom build your learning experience during this 8-part interactive webcast series as we discuss the most advanced technologies for applications in military and aerospace. Find out more and register online at ni.com/milaero/webcasts
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Hands-on Introduction to Data Acquisition with LabVIEW: Register now! (17 March 2010)
Learn how to build high-performance, PC-based measurement systems in minutes. Attend this free, 3-hour hands-on seminar to learn how to design and build powerful measurement and control applications using LabVIEW graphical programming.
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Data Acquisition on Any Bus seminar: Register now! (10 March 2010)
Learn how to optimise your data acquisition (DAQ) system. Attend this free, 3-hour seminar and evaluate the benefits and characteristics of measurement buses, to see which will best match your requirements.
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Automated Test Summit: Register now for this industry event! (10 March 2010)
Come along to our Automated Test Summit and learn more about top trends influencing the automated test industry. This FREE, full day event, features technical training, demonstrations, case studies and hands-on sessions about the latest technologies...
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Simplifying Robotics with LabVIEW and NI RIO hardware tools (24 February 2010)
National Instruments offers intuitive and productive design, prototyping and deployment tools for everything from autonomous vehicles and teaching robotics design principles, to fixed-base industrial robotic control.
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Panasonic Selects NI Products to Test Toughbook Laptop PCBs (24 February 2010)
Panasonic engineers have selected National Instruments hardware and software products for automated testing of new computer PCBs, including those in their new Toughbook rugged laptops. Learn more about how Panasonic use NI products for automated test.
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Panasonic Selects NI Products to Test Toughbook Laptop PCBs (16 February 2010)
Panasonic engineers have selected National Instruments hardware and software products for automated testing of new computer PCBs, including those in their new Toughbook rugged laptops. Learn more about how Panasonic use NI products for automated test at
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Academic and professional software (15 January 2010)
NI has introduced Multisim 11, the latest version of its circuit simulation software.
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Panasonic Selects NI Products to Test Toughbook Laptop PCBs (12 January 2010)
Panasonic engineers have selected National Instruments hardware and software products for automated testing of new computer PCBs, including those in their new Toughbook rugged laptops. Learn more about how Panasonic use NI products for automated test at
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See what you missed at NIDays09: view webcasts and download presentations (08 December 2009)
NIDays, the annual Graphical System Design conference hosted by National Instruments in association with The IET, was attended by over 400 engineers, scientists and educators involved in measurement and automation.
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Low Cost. High Performance. PC-based measurements from only £69. (10 November 2009)
At lower cost than you might think, National Instruments provides an intuitive platform that can connect to thousands of sensors and instruments to acquire, analyse and process signals, and present results graphically. Explore the range and buy online
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Best of a global week in a British day (20 October 2009)
NIDays is a free, multi-track conference and exhibition for engineers to explore the latest tools and technologies from National Instruments.
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Deep sleep in safe hands as anaesthetic automated (20 October 2009)
LabVIEW Software was used in developing a closed-loop control method for an automated anaesthesia system as Dr. Thomas M. Hemmerling reports
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Andy Green, World Land Speed Record Holder, to give Keynote at NIDays09 (06 October 2009)
Hear Andy Green OBE, RAF fighter pilot, World Land Speed record holder and 'the fastest mathematician on Earth', give the keynote address at NIDays, London, November 2009.
Explore the agenda and register at
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Prototype faster with LabVIEW 2009 (09 September 2009)
LabVIEW 2009 introduces the new NI C Interface to LabVIEW FPGA that helps C designers program in real-time on NI hardware and interface to an FPGA. Learn more about LabVIEW 2009 and download the free evaluation software.
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LabVIEW 2009 - Do More with Next Generation Technologies (07 September 2009)
LabVIEW 2009 simplifies development challenges of parallel hardware architectures with multicore programming enhancements and new virtualization technology. Learn more about LabVIEW 2009 and download the free evaluation software.
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Express DAQ provides X factor (01 September 2009)
New devices add advanced timing, synchronisation and optimisation for multicore CPUs
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Is your Test System up to the task? (22 July 2009)
As device complexity increases, reduce time to market by adopting a commercial-off-the-shelf FPGA platform.
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How can I use LabVIEW?... Six measurement, control and embedded design application areas (17 July 2009)
From simple temperature measurements to controlling the world’s largest particle accelerator, engineers and scientists use the LabVIEW graphical system design platform to meet a wide range of application challenges. See how LabVIEW can work for you at
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Applying Top Trends in Test in a Tough Economy (02 July 2009)
The sixth annual Automated Test Summit featured NI and industry experts discussing how to apply proven methods from the top trends in test that will significantly improve the efficiency of test and measurement systems in 2009. View these on-demand presentations
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What is LabVIEW?... Graphical programming for engineers and scientists (08 June 2009)
LabVIEW is a graphical programming environment used by millions of engineers and scientists to develop sophisticated measurement, test and control systems using intuitive graphical icons and wires that resemble a flowchart.
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How can I use LabVIEW?... Six measurement, control and embedded design application areas (08 June 2009)
From simple temperature measurements to controlling the world’s largest particle accelerator, engineers and scientists use the LabVIEW graphical system design platform to meet a wide range of application challenges. See how LabVIEW can work for you at
Read more... More..
How can I use LabVIEW for Designing Embedded Systems? (08 June 2009)
NI LabVIEW is a complete graphical development solution to efficiently design, prototype and deploy embedded applications in a single environment. Watch the 3 minute demo and explore the top 10 reasons to use LabVIEW for embedded design at
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How can I use LabVIEW for Instrument Control? (08 June 2009)
NI LabVIEW is a graphical programming environment that makes it easy to control and acquire data from any instrument over any bus. Watch the 3 minute demo and explore the top 10 reasons to use LabVIEW for instrument control at
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Low Cost. High Performance. PC-based measurements from £69 (01 May 2009)
At lower cost than you might think, National Instruments provides an intuitive platform that can connect to thousands of sensors and instruments to acquire, analyse and process signals, and present results graphically. Special pricing available for academic and OEM customers. Buy online and explore the range at
Read more... More..
Simplify Embedded Development with Graphical System Design (01 May 2009)
Discover how LabVIEW graphical system design software provides domain experts with high-level tools, such as statecharts, to design and implement their systems on off-the-shelf hardware. View the webcast at ni.com/labview/whatis/#embedded
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Join us at Mil/Aero 2009 Industry Solutions Conference (07 April 2009)
Attend the NI Military and Aerospace Solutions Conference and learn more about the latest developments in automated test, measurement technology and embedded design specifically for the military and aerospace industries. Hear from NI and industry engineers at this FREE one-day technical conference.
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Cost savings in automated test delivered from industry leaders (07 April 2009)
National Instruments has helped more than 25,000 companies around the world improve their automated test and measurement strategies. Learn how industry leaders, including Philips, Lockheed Martin, Motorola and Microsoft are using NI software and hardware to research, design, test, automate, and improve products and services.
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How-To-Guide for top ten most common measurements (23 March 2009)
Learn how to quickly make the most common sensor and signal measurements, including temperature, voltage, current, strain and pressure. Explore the theory for the corresponding signal/sensor and review practical step-by-step guidance on how to make that measurement in minutes.
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Try NI LabVIEW for Free (04 March 2009)
Test drive LabVIEW graphical programming and learn how it improves the productivity of your test and measurement, industrial control and embeddded design applications through step-by-step exercises and tips. Test drive LabVIEW online in minutes, download an evaluation copy in hours or request it on DVD.
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Trends in T&M reduce the cost of test - learn how at ni.com (09 February 2009)
As the global economic climate places additional constraints on budgets, test engineers are challenged to identify ways to test devices more efficiently than ever before. National Instruments has identified three trends that will significantly improve the efficiency of test and measurement systems in 2009.
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Low Cost. High Performance. PC-based measurements from only £69! (09 February 2009)
At lower cost than you might think, National Instruments provides an intuitive platform that can connect to thousands of sensors and instruments to acquire, analyse and process signals, and present results graphically. Buy online and explore the full range at
Read more... More..
The Future of GPIB (13 January 2009)
Learn about the history and future of GPIB (IEEE 488), as well as the latest instrument control bus technologies.
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Measurements in minutes with NI LabVIEW (13 January 2009)
Find out what LabVIEW is and how it can improve the productivity of your test and measurement, industrial control and embeddded design applications. Take the guided tour and test drive LabVIEW online, download an evaluation copy or request an evaluation copy on DVD.
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Low Cost. High Performance. Measurements from National Instruments (09 December 2008)
At a lower cost than you might think, NI provides an intuitive platform that can connect to thousands of sensors and instruments to acquire signals, analyse data and present results. Special prices for education and OEM applications. Buy online and explore the range.
Read more... More..
Build versus Buy - Understanding the Cost of Embedded Design (18 November 2008)
When developing an embedded device, deciding which technology to implement as the system's primary controller is one of the first key engineering milestones. Read this white paper at ni.com/developerzone.
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Reduce Semiconductor Validation Costs with NI Instrumentation (11 November 2008)
See how adopting flexible hardware platforms, such as PXI, and scalable software, such as NI TestStand can decrease costs and increase the flexibility of semiconductor validation test. Learn how to create customised test systems that you can repurpose to meet evolving test needs. View reference architectures and video demos.
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Integrating Design and Test with NI LabVIEW and Multisim (05 November 2008)
Learn how to improve the design and validation of printed circuit boards (PCBs) through an intuitive platform that integrates design and test.
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NIDays 2008: Free professional development conference (03 October 2008)
NIDays is the development conference and exhibition for engineers and scientists involved in measurement, automation and embedded design, hosted by National Instruments, in association with the Institution of Engineering & Technology, in November at Savoy Place, London. View the full agenda and register now for this FREE event.
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LabVIEW version looks to next-gen multi-core (22 September 2008)
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Go Wireless with Your Measurements (01 September 2008)
Explore simple, secure NI Wi-Fi data acquisition (DAQ) devices combining IEEE 802.11g wireless or Ethernet communication, direct sensor connectivity and network security to simplify remote monitoring of electrical, physical, mechanical and acoustic signals. View a 6-minute guided tour.
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Develop High-Performance Test Systems with NI LabVIEW 8.6 (01 September 2008)
Test devices up to 10X faster with National Instruments LabVIEW software. LabVIEW improves test throughput by creating parallel applications that exploit the performance of multicore systems. Test wireless protocols standards including WLAN, WiMAX, DVB-T and GPS. View demos and evaluate now
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Next generation wireless tests (06 August 2008)
RF technology is everywhere, and all signs point to the integration of more wireless devices in the future
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Software adds multi-core test (05 August 2008)
A new version of LabVIEW introduces FPGA and multi-core processing to the masses.
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Your How-To Guide for the Most Common Sensor Measurements (05 August 2008)
National Instruments offers practical how-to guides for the 10 most common measurements, helping you to kick-start your projects. See detailed information and access the how-to guides.
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See How You Can Take Advantage of Wireless Technology (16 July 2008)
The growth of the wireless industry is a driving force behind innovation in telecommunications and environmental research. Learn how to benefit from using wireless technology.
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Your How-To Guide for the Most Common Sensor Measurements (16 July 2008)
National Instruments offers practical how-to guides for the 10 most common measurements, helping you to kick-start your projects. See detailed information and access the how-to guides at
ni.com/devzone... More..
Software simplifies channel-count (15 July 2008)
DIAdem 11.0, the latest version of National Instruments’ interactive software for test data, adds sensor data mapping.
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Robot control system is a FIRST (12 June 2008)
FIRST (For Inspiration and Recognition of Science and Technology), a non-profit organisation that inspires young people to be science and technology leaders, has selected the National Instruments’ (www.ni.com) CompactRIO embedded control platform as its next-generation FIRST Robotics competition robot controller.
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NEW exhibitors announced (12 June 2008)
National Electronics Week (NEW) is being held at Earls Court from 17 to 19 June.
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Choosing the brain to control the heart (11 June 2008)
Medical device development can be a slippery slope to climb. Even when dealing with proven science, three fundamental and opposing pressures drive the development process.
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NI introduces bus-powered USB digital multimeter (DMM) (03 June 2008)
The USB DMM from National Instruments provides digital multimeter functionality for cost-sensitive applications, complete with NI LabVIEW SignalExpress LE. Get 6½-digits of resolution for £799.
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Software adds T&M to Visual Studio (03 June 2008)
Test and measurement functionality can be added to Microsoft’s development environment.
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ELVIS contributes to interactive, hands-on learning (22 May 2008)
National Instruments announces ELVIS II, the LabVIEW-based USB plug and play design and prototyping platform.
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HIL is a new frontier in test (14 May 2008)
HIL simulation has become an essential tool in the embedded system designer’s toolbox. It now plays a major role in development programs across a broad range of industries
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Simplifying embedded system development (06 May 2008)
NI and ARM collaboration results in a module aiming to simplify embedded system development.
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NI announces two low-cost PXI embedded controllers for test, measurement and control applications (25 April 2008)
New controllers deliver optimal value and up to 40 per cent increased performance.
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Test & Measurement Design Day featuring NI, Tektronix and Agilent (16 April 2008)
T&M Design Day is an industry event focusing on next generation solutions for T&M - make sense of this increasingly complex technology sector.
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Portable acquisition (16 April 2008)
A bus-powered data acquisition format introduces high-rel features to USB domain.
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NI LabVIEW to the Pin: semiconductor validation (09 April 2008)
Precisely characterise voltage and current parameters on high-pin-count devices using PXI source measure unit (SMU) and PXI switches from NI.
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Next generation test systems (19 March 2008)
Test managers and engineers use automated test systems in applications from design validation to end-of-line production test.
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NI introduces portable bus-powered devices (03 March 2008)
National Instruments is expanding the measurements offered by portable instrumentation with new small, bus-powered performance devices including digitisers, digital multimeter and a 6 GHz power meter. View pricing, specs and video demos now.
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NI Product Guide: Technologies for Test, Control & Design (13 February 2008)
The NEW Product Guide from National Instruments offers an overview of the NI platform for measurement and automation, including LabVIEW graphical programming software, and modular measurement and control hardware for practically any bus and OS.
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NI signs to Multicore Association (08 February 2008)
National Instruments has joined The Multicore Association, focused on developing standards for multicore implementations.
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Mechatronics: Integrated Mechanical, Electrical, Control & Embedded Software Design (08 February 2008)
Mechatronics is a system-level approach to designing electromechanical systems, merging mechanical, electrical, control system and embedded software design. Mechatronics technology can help you streamline design, prototyping and deployment, lowering development costs, reducing risk and producing higher-quality products.
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Graphical design develops robotics (01 January 2008)
LabVIEW is used to control the robotic arm responsible for precise photodynamic therapy application for patients.
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LabVIEW 8.5 serves power of multi-core (01 November 2007)
Processor speeds have hit a wall in recent years. Moore’s Law, which states that the number of transistors on a chip will double every 18 to 24 months, still holds true as it has for the last 40 years, but it no longer translates into a linear increase in performance
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Graphical approach to system design (01 October 2007)
Electronic devices and systems, whether for consumer or industrial markets, are increasing in complexity, driven by the desire for more functionality and greater ease of use
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NI adds multi-core performance to LabVIEW (01 September 2007)
In Austin, last month, National Instruments announced LabView 8.5, reducing the programming complexity associated with control systems based on multi-core and FPGA architectures. Programmers can use a simplified, graphical approach to multi-threading, maximising the technology’s performance with little or no code change.
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NI's PXI Express responds to multi-core technology (01 June 2007)
Responding to the increased use in multi-core technology, especially in PCs, National Instruments (www.ni.com) has introduced PXI Express high-speed instruments and an 18-slot PXI Express chassis.
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Multi-core or multiprocessor? (01 April 2007)
Multi-core processing has been touted as the next generation of improvements in processing power. Performance looks set to improve once more having been plagued by problems of heat and power consumption resulting from increased processor clock speed
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FPGA joins the house of test (01 January 2007)
How FPGA-based reconfigurable I/O helped speed up automated high voltage defibrillator testing for Medtronic.
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CompactRIO collaboration (01 December 2006)
Three significant names in electronics, Freescale Semiconductor, National Instruments (www.ni.com) and software company Wind River, have collaborated on a CompactRIO controller, designed to enable design engineers to simplify embedded system development using graphical system design. CompactRIO is ahigh-performance, embedded control and acquisition platform, powered by National Instruments’ LabVIEW FPGA and Real-Time.
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Toolkit set to ease junior programming (01 September 2006)
National Instruments (www.ni.com) has announced the LabVIEW Toolkit for Lego MindStorme NXT to create and download VI (Virtual Instruments) to operate and control the MindStorm NXT robotics platform.
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Thrive on variation (01 August 2006)
New avenues for test equipment may create some unusual applications and test the ingenuity of designers, writes TOM BRESLIN
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